Journal
  • Publication
  • Journal
Deep Electron Traps Responsible for Higher Quantum Efficiency in Improved GaN/InGaN Light Emitting Diodes Embedded with SiO2 Nanoparticles
Year 2016
Journal ECS J. Solid State Sci. Technol.
Author A. Y. Polyakov, N. B. Smirnov, E. B. Yakimov, Han-Su Cho, Jong Hyeob Baek, A. V. Turutin, I. V. Shemerov, E. S. Kondratyev, In-Hwan Lee*
.