Degradation-induced low frequency noise and deep traps in GaN/InGaN near-UV LEDs > Journal

Publication Laboratory for Optoelectronic Materials

Degradation-induced low frequency noise and deep traps in GaN/InGaN near-UV LEDs
Year	2017
Author	In-Hwan Lee, A.Y. Polyakov, Sung-Min Hwang, N.M. Shmidt, E.I. Shabunina, N.A. Tal'nishnih, N.B. Smirnov, I.V. Shchemerov, R.A. Zinovyev, S.A. Tarelkin, S.J. Pearton
Link	https://doi.org/10.1063/1.4985190 1326회 연결
IF: 3.41 (JCR Top 19.2%) https://doi.org/10.1063/1.4985190 Publication date: 07 Aug 2017